Publication Citation
NIST Authors in Bold
 |
| Author(s): | Jin S. Kim; David G. Seiler; W. F. Tseng; |
|---|---|
| Title: | Multicarrier Characterization Method for Extracting Mobilities and Carrier Densities of Semiconductors from Variable Magnetic Field Measurements |
| Published: | June 15, 1993 |
| Abstract: | |
| Citation: | Journal of Applied Physics |
| Volume: | 73 |
| Issue: | 12 |
| Pages: | pp. 8324 - 8335 |
| Research Areas: |