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Publication Citation: Multicarrier Characterization Method for Extracting Mobilities and Carrier Densities of Semiconductors from Variable Magnetic Field Measurements

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Author(s): Jin S. Kim; David G. Seiler; W. F. Tseng;
Title: Multicarrier Characterization Method for Extracting Mobilities and Carrier Densities of Semiconductors from Variable Magnetic Field Measurements
Published: June 15, 1993
Abstract:
Citation: Journal of Applied Physics
Volume: 73
Issue: 12
Pages: pp. 8324 - 8335
Research Areas: