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Publication Citation: Emittance standards for improved radiation thermometry during thermal processing of silicon materials, ed. by D. Zvizdic

NIST Authors in Bold

Author(s): Benjamin K. Tsai; D P. DeWitt; E A. Early; Leonard M. Hanssen; Sergey Mekhontsev; Matthias Rink; K G. Kreider; B J. Lee; Z M. Zhang;
Title: Emittance standards for improved radiation thermometry during thermal processing of silicon materials, ed. by D. Zvizdic
Published: January 01, 2005
Abstract:
Conference: Proc. TEMPMEKO 2004
Proceedings: TEMPMEKO 2004
Pages: pp. 1179 - 1184
Location: Zagreb, IL
Dates: June 22-25, 2004
Research Areas: