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Publication Citation: FT-IR Based Ellipsometer Using High-Quality Brewster-Angle Polarizers

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Author(s): Simon G. Kaplan; Leonard M. Hanssen;
Title: FT-IR Based Ellipsometer Using High-Quality Brewster-Angle Polarizers
Published: January 01, 1999
Abstract:
Conference: Proc. SPIE Conference Polarization: Measurement, Analysis and Remote Sensing II
Proceedings: Conference Polarization: Measurement, Analysis and Remote Sensing II
Location: Volume: 3754 Pages: 285-293, HU
Research Areas: