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Publication Citation: Fourier Transform System for Characterization of Infrared Spectral Emittance of Materials, ed. by B. Fellmuth, J. Seidel, and G. Scholz

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Author(s): Leonard M. Hanssen; Simon G. Kaplan; Sergey Mekhontsev;
Title: Fourier Transform System for Characterization of Infrared Spectral Emittance of Materials, ed. by B. Fellmuth, J. Seidel, and G. Scholz
Published: January 01, 2003
Abstract:
Conference: Proc. 8th Int'l Symp. Temperature and Thermal Measurements in Industry and Science
Proceedings: 8th Int''l Symp. Temperature and Thermal Measurements in Industry and Science
Pages: pp. 265 - 270
Location: Berlin, GE
Dates: June 19-21, 2001
Research Areas: