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Publication Citation: High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer

NIST Authors in Bold

Author(s): Simon G. Kaplan; R Gupta;
Title: High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer
Published: January 01, 2003
Abstract:
Citation: Journal of Research (NIST JRES) -
Volume: 108
Pages: pp. 429 - 437
Research Areas: