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Publication Citation: Linearity Characterization of NIST's Infrared Regular Transmittance and Reflectance Scales

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Author(s): Leonard M. Hanssen; Simon G. Kaplan;
Title: Linearity Characterization of NIST's Infrared Regular Transmittance and Reflectance Scales
Published: January 01, 2003
Abstract:
Citation: SPIE Proc
Volume: 4826
Pages: pp. 21 - 26
Research Areas: