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Publication Citation: Characterization of UV-Induced Radiation Damage in Si-based Photodiodes

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Author(s): R Gupta; Keith R. Lykke; Ping-Shine Shaw; J L. Dehmer;
Title: Characterization of UV-Induced Radiation Damage in Si-based Photodiodes
Published: January 01, 1999
Abstract:
Citation: SPIE
Volume: 3818
Pages: pp. 27 - 33
Research Areas: