NIST Authors in Bold
| Author(s): | B Budhlall; G Parris; P Zhang; X Gao; Z Zarkov; B Ross; Simon G. Kaplan; J Burnett; |
|---|---|
| Title: | High refractive index immersion fluids for 193 nm immersion lithography |
| Published: | January 01, 2005 |
| Abstract: | |
| Citation: | SPIE |
| Volume: | 5754 |
| Pages: | pp. 622 - 629 |
| Research Areas: |