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Publication Citation: Slip Correction Measurements of Certified PSL Nanoparticles Using a Nanometer Differential Mobility Analyzer (Nano-DMA) for Knudsen Number From 0.5 to 83.

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Author(s): J H. Kim; George W. Mulholland; S R. Kukuck; D Y. Pui;
Title: Slip Correction Measurements of Certified PSL Nanoparticles Using a Nanometer Differential Mobility Analyzer (Nano-DMA) for Knudsen Number From 0.5 to 83.
Published: December 01, 2005
Abstract:
Citation: Journal of Research of the National Institute of Standards and Technology
Volume: 110
Issue: 1
Pages: pp. 31 - 54
Research Areas: Building and Fire Research
PDF version: PDF Document Click here to retrieve PDF version of paper (1MB)