Publication Citation
NIST Authors in Bold
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| Author(s): | Dylan F. Williams; Uwe Arz; Hartmut Grabinski; |
|---|---|
| Title: | Accurate Characteristic Impedance Measurement on Silicon |
| Published: | June 01, 1998 |
| Abstract: | |
| Proceedings: | Tech. Dig., IEEE MTT-S International Microwave Symposium |
| Pages: | pp. 1917 - 1920 |
| Location: | Baltimore, MD |
| Dates: | June 7-12, 1998 |
| Research Areas: | Microwave Measurement Services |