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Publication Citation: Accurate Characteristic Impedance Measurement on Silicon

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Author(s): Dylan F. Williams; Uwe Arz; Hartmut Grabinski;
Title: Accurate Characteristic Impedance Measurement on Silicon
Published: June 01, 1998
Abstract:
Proceedings: Tech. Dig., IEEE MTT-S International Microwave Symposium
Pages: pp. 1917 - 1920
Location: Baltimore, MD
Dates: June 7-12, 1998
Research Areas: Microwave Measurement Services