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NIST Authors in Bold
|Author(s):||Dylan F. Williams; Uwe Arz; Hartmut Grabinski;|
|Title:||Accurate Characteristic Impedance Measurement on Silicon|
|Published:||June 01, 1998|
|Abstract:||This paper presents a new method that accurately determines the characteristic impedance of planar transmission lines printed on lossy dielectrics even when contact-pad capacitance and conductance are large. We demonstrate the method on a coplanar waveguide fabricated on fused silica and a microstrip line fabricated on a highly conductive silicon substrate.|
|Proceedings:||Tech. Dig., IEEE MTT-S International Microwave Symposium|
|Pages:||pp. 1917 - 1920|
|Dates:||June 7-12, 1998|
|Research Areas:||Microwave Measurement Services|
|DOI:||http://dx.doi.org/10.1109/MWSYM.1998.700955 (Note: May link to a non-U.S. Government webpage)|
|PDF version:||Click here to retrieve PDF version of paper (371KB)|