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Manufacturing Programs & Projects

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SI Length and Traceability
Last Updated Date: 08/01/2013

In total, the SI Length and Traceability project addresses some central aspects of three cornerstones of precision length measurements: … more

High Rate Tensile Testing
Last Updated Date: 07/02/2013

High rate tensile testing summary pending

Thin Film Electronics
Last Updated Date: 07/01/2013

The Thin Film Electronics Project enables the commercialization of emerging and future semiconductor electronic device technologies, such as … more

In Situ Characterization of Nanoscale Gas-Solid Interactions by TEM
Last Updated Date: 06/28/2013

Observing and measuring the dynamic changes that take place at the nanometer scale during the synthesis and operation of active nanostructures is … more

MEMS Measurement Science and Standards
Last Updated Date: 05/09/2013

Our goal is to provide technical leadership in R&D for the MEMS measurement infrastructure essential to improving U.S. economic … more

Traceable Scanning Probe Nano-Characterization
Last Updated Date: 05/08/2013

Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more

Advanced Dimensional Measurement Systems for Manufacturing
Last Updated Date: 05/03/2013

The discrete manufacturing industry is experiencing an increase in the variety of dimensional measuring systems available to inspect manufactured … more

Three-Dimensional Nanometer Metrology
Last Updated Date: 04/30/2013

Three-dimensional measurements of nanometer-scale structures are of increasing importance for nanoscience and nanomanufacturing, including the … more

Dimensional Measurement Services
Last Updated Date: 04/23/2013

The Dimensional Measurement Services Project within the Semiconductor & Dimensional Metrology Division (683) of the Physical Measurement … more

Optical Surface Metrology and Nano-Structured Optics
Last Updated Date: 04/19/2013

Aspheric surfaces are indispensable in high-performance optical systems. The ability to accurately manufacture these surfaces to the required … more

Atom-Based Dimensional Metrology
Last Updated Date: 04/19/2013

A primary goal of this project is to develop intrinsic calibration standards based on the crystalline lattice. The ultimate limit for nanoscale … more

Forensic Topography and Surface Metrology
Last Updated Date: 04/19/2013

Provide SI-traceable measurements and standards for ballistic and toolmark identification and surface texture and microform calibrations. Enable … more

Nanoparticle Metrology
Last Updated Date: 04/19/2013

We are advancing the measurement of dimension and function of engineered nanoparticles for biomedical research, manufacturing, and environmental … more

CMOS Device and Reliability
Last Updated Date: 04/11/2013

The CMOS Device and Reliability Project will develop advanced metrology tools to enable high performance CMOS (Complementary Metal Oxide … more

Nanoelectronic Device Metrology
Last Updated Date: 04/09/2013

The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable emerging “Beyond-CMOS” … more

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