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Manufacturing Programs & Projects

(showing 1 - 15 of 95)
Nanoscale Stress Measurements and Standards
Last Updated Date: 11/21/2014

Our objective is to develop accurate measurement methods for the nanoscale stress distributions and surface defects that control device … more

Wireless Systems Metrology
Last Updated Date: 11/20/2014

Imagine how much safer a fire fighter's job would be if it were possible for a robot to navigate in a burning building and locate those in need of … more

Antenna Metrology
Last Updated Date: 11/20/2014

Antennas are the eyes, ears and voices of everything from cell phones to interplanetary spacecraft. The Antenna Metrology Program carries on PML's … more

Advanced Dimensional Measurement Systems for Manufacturing
Last Updated Date: 10/21/2014

The US manufacturing industry is experiencing an increase in the variety of dimensional measuring systems available to more rapidly inspect high … more

Standard Test Methods for Response Robots
Last Updated Date: 10/15/2014

The U.S. National Institute of Standards and Technology (NIST) is developing a comprehensive set of standard test methods and associated … more

Optical Methods for 3-D Nanostructure Metrology
Last Updated Date: 10/01/2014

We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more

SI Length and Traceability
Last Updated Date: 10/01/2014

In total, the SI Length and Traceability project addresses some central aspects of three cornerstones of precision length measurements: … more

Nano-Structured Optics and Optical Surface Metrology
Last Updated Date: 09/30/2014

Aspheric, free-form, and nano-structured surfaces are indispensable in high-performance optical systems. The ability to accurately manufacture … more

Nanoelectronic Device Metrology
Last Updated Date: 09/30/2014

The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable emerging nanoelectronic … more

Dimensional Measurement Services
Last Updated Date: 09/30/2014

The Dimensional Measurement Services Project within the Semiconductor & Dimensional Metrology Division (683) of the Physical Measurement … more

Atom-Based Dimensional Metrology
Last Updated Date: 09/30/2014

A primary goal of this project is to develop intrinsic calibration standards based on the crystalline lattice. The ultimate limit for nanoscale … more

Forensic Topography and Surface Metrology
Last Updated Date: 09/30/2014

Provide SI-traceable measurements and standards for ballistic and toolmark identification and surface texture and microform calibrations. Enable … more

CMOS Device and Reliability
Last Updated Date: 09/29/2014

The CMOS Device and Reliability Project develops advanced metrology tools to enable high performance CMOS (Complementary Metal Oxide Semiconductor) … more

Thin Film Electronics
Last Updated Date: 09/23/2014

The Thin Film Electronics Project facilitates the commercialization of emerging and future semiconductor electronic device technologies by … more

Traceable Scanning Probe Nano-Characterization
Last Updated Date: 09/23/2014

Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more

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