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Manufacturing News

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Nanoscale Dimensioning Is Fast, Cheap with New NIST Optical Technique
Release Date: 10/28/2008

A novel technique under development at the National Institute of Standards and Technology (NIST) uses a relatively inexpensive optical microscope … more

New Report on NIST Tests of Wireless Environment in Auto Factories
Release Date: 10/14/2008

A new report describes tests carried out by the National Institute of Standards and Technology (NIST) of the wireless environment in automotive … more

NIST Studies How New Helium Ion Microscope Measures Up
Release Date: 09/03/2008

Just as test pilots push planes to explore their limits, researchers at the National Institute of Standards and Technology (NIST) are probing the … more

Stop the Waste: Making Measurements Measure Up to Standards
Release Date: 08/19/2008

Information standards enable common activities. For instance, bring your laptop anywhere in the world and you will quickly and cheaply find a … more

‘Electron Trapping’ May Impact Future Microelectronics Measurements
Release Date: 06/24/2008

Using an ultra-fast method of measuring how a transistor switches from the “off” to the “on” state, researchers at the National Institute of … more

Tests Check Out Rescue Robots' Life-Saving Vision
Release Date: 06/10/2008

To save lives, search and rescue robots crawling through the rubble of a collapsed building or surveying a chemical spill area must be capable of … more

Word/Logic Bank to Help Build ‘Thinking’ Machines
Release Date: 05/28/2008

Information scientists announced an agreement last month on a “concept bank” programmers could use to build thinking machines that reason about … more

NIST Third Interoperability Week April 28-May 2
Release Date: 04/01/2008

For manufacturing engineers and linguists “interoperability” and “ontology” go together like horse and carriage—“you can’t have one without the … more

Software Tackles Production Line Machine ‘Cyclic Jitters’
Release Date: 04/01/2008

Electronic commands passed from machine to machine over data networks increasingly drive today’s precisely timed and sequenced manufacturing … more

April Conferences Focus on Scanning Advances
Release Date: 03/18/2008

Since the advent of the scanning electron microscope (SEM) in the 1930s, that instrument and its many and diverse descendents—including atomic … more

Report Identifies Three Key R&D Priorities for Future Manufacturing
Release Date: 03/18/2008

A new report identifies and describes research and development priorities for the future of three critical, high-tech U.S. manufacturing … more

Report Identifies Three Key R&D Priorities for Future Manufacturing
Release Date: 03/14/2008

A new report published today identifies and describes research and development priorities for the future of three critical, high-tech U.S. … more

NIST Web Site Features Waldseemüller Map Video
Release Date: 03/05/2008

Visitors to the National Institute of Standards and Technology (NIST) Web site can view a video that portrays NIST’s construction of an encasement … more

‘Nitty-Gritty’ but Vital Data Helps Field Rescue Robots
Release Date: 02/05/2008

A new ASTM International standard for urban search and rescue robots and components tackles humble logistics problems that, left unsolved, could … more

NIST Encasement Now Protecting ‘America’s Birth Certificate’
Release Date: 12/12/2007

NIST technician Dana Strawbridge bolts the top frame of the map encasement to its base during a test sealing of the encasement prior to shipping … more

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