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September PerMIS Workshop Takes Measure of Intelligent System Performance
Release Date: 07/28/2009

Intelligent machines of the future will turn custom designs into finished products quickly and efficiently, save lives in catastrophes, and … more

Performance Evaluation and Benchmarking of Robotic and Automation Systems
Release Date: 07/09/2009

The IEEE Robotics and Automation Society approved formation of a new Technical Committee entitled "Performance Evaluation and Benchmarking of … more

NIST Extends Deadline for 2009 Technology Innovation Program Competition
Release Date: 06/30/2009

The National Institute of Standards and Technology (NIST) announced today that it is extending the deadline for submitting proposals to its … more

Rescue Robot Exercise Brings Together Robots, Developers, First Responders
Release Date: 11/25/2008

The National Institute of Standards and Technology (NIST) held a rescue robot exercise in Texas last week in which about three dozen robots were … more

Bright Idea Illuminates LED Standards
Release Date: 11/25/2008

The lack of common measurement methods among light-emitting diode (LED) and lighting manufacturers has affected the commercialization of … more

Nanoscale Dimensioning Is Fast, Cheap with New NIST Optical Technique
Release Date: 10/28/2008

A novel technique under development at the National Institute of Standards and Technology (NIST) uses a relatively inexpensive optical microscope … more

New Report on NIST Tests of Wireless Environment in Auto Factories
Release Date: 10/14/2008

A new report describes tests carried out by the National Institute of Standards and Technology (NIST) of the wireless environment in automotive … more

NIST Studies How New Helium Ion Microscope Measures Up
Release Date: 09/03/2008

Just as test pilots push planes to explore their limits, researchers at the National Institute of Standards and Technology (NIST) are probing the … more

Stop the Waste: Making Measurements Measure Up to Standards
Release Date: 08/19/2008

Information standards enable common activities. For instance, bring your laptop anywhere in the world and you will quickly and cheaply find a … more

‘Electron Trapping’ May Impact Future Microelectronics Measurements
Release Date: 06/24/2008

Using an ultra-fast method of measuring how a transistor switches from the “off” to the “on” state, researchers at the National Institute of … more

Tests Check Out Rescue Robots' Life-Saving Vision
Release Date: 06/10/2008

To save lives, search and rescue robots crawling through the rubble of a collapsed building or surveying a chemical spill area must be capable of … more

Word/Logic Bank to Help Build ‘Thinking’ Machines
Release Date: 05/28/2008

Information scientists announced an agreement last month on a “concept bank” programmers could use to build thinking machines that reason about … more

NIST Third Interoperability Week April 28-May 2
Release Date: 04/01/2008

For manufacturing engineers and linguists “interoperability” and “ontology” go together like horse and carriage—“you can’t have one without the … more

Software Tackles Production Line Machine ‘Cyclic Jitters’
Release Date: 04/01/2008

Electronic commands passed from machine to machine over data networks increasingly drive today’s precisely timed and sequenced manufacturing … more

April Conferences Focus on Scanning Advances
Release Date: 03/18/2008

Since the advent of the scanning electron microscope (SEM) in the 1930s, that instrument and its many and diverse descendents—including atomic … more

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