NIST logo
  • NIST Time
  • NIST Home
  • About NIST
  • Contact Us
  • A-Z Site Index
Information Technology Laboratory
  • About ITL
    • What ITL does
    • Organization
    • ITL Functional Statement
    • ITL History Timeline
    • ITL Opportunities
  • Publications
  • Topic/Subject Areas
    • Math
    • Networking
    • Statistics
    • Computer Security
    • Software
    • Usability
    • Site Map
  • Products/Services
    • CSRC
    • Digital Library of Math Functions
    • Engineering Statistics Handbook
    • Guide to Available Math Software
    • Matrix Market Database
    • Template Numerical Toolkit
    • ANSI Accredited Standards Dev.
    • Anthropometric Data of Children
    • Dictionary of Algorithms & Data
    • Fortran Interface to Open GL
    • OO Micromagnetic Frame
    • Statistical Reference Datasets
    • Metadata Conformance Analyzer
    • National Software Reference Library
    • SCRIBA
  • News/Multimedia
  • Programs/Projects
NIST Home > ITL > Statistical Engineering Division > Seminar Series

Seminar Series

< Previous 1 2 Next »

A Latent Variable Model for Hybrid Data from Interlaboratory Comparisons

A Rules Based Statistical Algorithm for Keystroke Detection

Allan Variance and the Uncertainty of the Autocorrelated Measurements

Blank Corrections Using a Linear Regression Approach

Calibration and Uncertainty Analysis of Predictions from Computer Experiments

Computer Experiments for an Alternative Approach to Mass Measurement

Confidence Sets for Parameters of a Linear Model and Dirichlet Averages

Copulas for Uncertainty Analysis

Experimental Design in the Scheduling of Two Unrelated Parallel Processors

Exponential Smoothing and State-Space Modeling

Hierarchical Bayesian Spatio-Temporal Models for Environmental Processes: PDE-Based Dynamics and Efficient Parameterizations

Information Metrology and Image Analysis Research at NIM, China

Information-Theoretic Estimation and Data Analysis

Low Cost Reference Objects for Medical Imaging

Measurement Performance Issues in Microarray Gene Expression Images and Spike-in Experiments

< Previous 1 2 Next »
Contact
Information Technology Laboratory (ITL)

Statistical Engineering Division (SED)

Antonio Possolo, Chief
antonio.possolo@nist.gov

100 Bureau Drive, M/S 8980
Gaithersburg, MD 20899-8980

301-975-2853 Telephone
301-975-3144 Facsimile

If you have any questions regarding this website, or notice any problems or inaccurate information, please contact the webmaster by sending e-mail to: sedwww@nist.gov

govdelivery bubble icon Sign Up for NIST E-mail alerts:

The National Institute of Standards and Technology (NIST) is an agency of the U.S. Department of Commerce.

Privacy Policy / Security Notice / Accessibility Statement / Disclaimer / Freedom of Information Act (FOIA) /
Environmental Policy Statement / No Fear Act Policy / NIST Information Quality Standards /
Scientific Integrity Summary

Date created: September 7, 2010 | Last updated: December 2, 2011    Contact: Webmaster