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Focused Ion Beam Milling (FIB) Information at NIST

  • Analysis of 3D Elemental Mapping Artifacts in Biological Specimens using Monte Carlo Simulation

  • Assessing the Internal Structure and Composition of Climatically-Relevant Atmospheric Particles

  • CNST Releases the Fall 2013 Edition of The CNST News

  • CNST Releases the Spring 2012 Edition of The CNST News

  • CNST Releases the Summer 2012 Edition of The CNST News

  • CNST Releases the Winter 2012 Edition of The CNST News

  • CNST Releases the Winter/Spring 2014 Edition of The CNST News

  • Coupling Nanowire Chemisresistors with MEMS Microhotplate Gas Sensing Platforms

  • Electron Microscopy of Carbon Nanotube Composites

  • Focused Ion Beam Nanofabrication and Characterization

  • Frank W. Gayle

  • Frontiers of In Situ Transmission Electron Microscopy

  • Joseph Conny

  • Nanoplasmonics and Three-Dimensional Plasmonic Metamaterials

  • NIST Puts a New Twist on the Electron Beam

  • Novel Sources for Focused-ion Beams

  • Novel Sources for Focused-ion Beams Laboratory

  • Now You See It: Electromagnetically Induced Transparency in a Silicon Nitride Optomechanical Crystal

  • Opto-mechanical Devices for Measuring Nanoplasmonic Metamaterials