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Optical Clocks Synched to Femtoseconds Over Air
Release Date: 04/21/2016

TOP: Time information is transmitted between sites across a turbulent air path. Real-time feedback is supplied to the clock at site B to … more

Department of Commerce Releases R&D Roadmap for Using Data Analysis to Enhance Public Safety
Release Date: 04/19/2016

WASHINGTON – The U.S. Department of Commerce today issued the Public Safety Analytics R&D Roadmap , which outlines opportunities to spur … more

Precision Testing for MEMS Accelerometers
Release Date: 04/08/2016

The goniometer-based instrument. The piv more

For Rechargeable Batteries That Crush the Competition, Crush This Material
Release Date: 04/01/2016

By chemically modifying and pulverizing a promising group of compounds, scientists at the National Institute of Standards and Technology (NIST) … more

Improving CD-AFM Measurements from the Tip Down
Release Date: 03/31/2016

Figure 1. Scanning electron microscope image of the SCCDRM sample, displaying the pattern of near-vertical sidewalls with varying linewidths, high … more

Multilingual Circuit: NIST’s “Optomechanical Transducer” Links Sound, Light and Radio Waves
Release Date: 03/28/2016

Researchers working at the National Institute of Standards and Technology (NIST) have developed a “piezo-optomechanical circuit” that converts … more

Not So Fast: Overlooked Resistance May Inflate Estimates of Organic-Semiconductor Performance
Release Date: 03/10/2016

It’s hardly a character flaw, but organic transistors—the kind envisioned for a host of flexible electronics devices—behave less than ideally, or … more

NIST Invents Fleet and Fast Test for Nanomanufacturing Quality Control
Release Date: 03/04/2016

Manufacturers may soon have a speedy and nondestructive way to test a wide array of materials under real-world conditions, thanks to an advance … more

New NIST Method May Find Elusive Flaws in Medical Implants and Spacecraft
Release Date: 02/29/2016

Medical implants and spacecraft can suddenly go dead, often for the same reason: cracks in ceramic capacitors, devices that store electric charge … more

NIST Requests Comments on Computer Security Publication on Randomness
Release Date: 01/27/2016

The National Institute of Standards and Technology (NIST) is seeking public comment on its latest draft of a publication intended to help computer … more

Less Jitter, More Bits: New Material for Detecting Photons Captures More Quantum Information
Release Date: 01/05/2016

Detecting individual particles of light just got a bit more precise—by 74 picoseconds to be exact—thanks to advances in materials by National … more

Measuring Nanoscale Features with Fractions of Light
Release Date: 12/02/2015

National Institute of Standards and Technology (NIST) researchers are seeing the light, but in an altogether different way. And how they are doing … more

Robot Adds New Twist to NIST Antenna Measurements and Calibrations
Release Date: 11/30/2015

The National Institute of Standards and Technology (NIST) has been pioneering antenna measurement methods for decades, but a new robot may be the … more

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NIST and Intel Get Critical (Dimensions) with X-rays
Release Date: 10/20/2015

Researchers from the National Institute of Standards and Technology (NIST) and Intel reported* success using an X-ray scattering technique to … more

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