MBE/TDP Summit - Presentation Repository

December 12 - 15, 2011
National Institute of Standards & Technology
Gaithersburg, MD

TOPIC	SPEAKER
OSD MBE/TDP Summit Objectives	Paul Huang/Simon Frechette
NIST Engineering Laboratory Manufacturing Programs Overview	Vijay Srinivasan, Simon Frechette, Fred Proctor, Alkan Donmez, Mike Shneier
NASA Integrated Model-centric Architecture	Paul Gill, NASA
Integrated Data Management Strategy in Support of MBE Life Cycle Management	Shelley Detrich, USGC
Model-based Engineering/Manufacturing Review from Y-12 National Security Complex	Donna Bennet, DOE
MBE Implementation at Enterprise Level Requirements	James Delaporte, NexTec
Engineered Resilient System	Scott Lucero, OSD
EDA Overview	Dennis Thompson, ATI
Industry and ManTech Interaction Success	David Baum, Raytheon
MBE for QC/QA	John Horst, NIST
Critical Product Tolerance Representation Requirements for MBD and Metrology Interop.	Curtis Brown, DoE/KCP
MBD for Dimensional Quality within a Heterogeneous Supply Base	Ron Snyder, Rolls Royce
Improving First Article Inspection in a Model-Based Environment	Ray Admire, Lockheed Martin
MBE Enabler of Intelligent GD&T	Bill Tandler, MultiMetrics
TDP Validation	Roy Whittenburg, UTRC
Reducing new product introduction time and cost through more effective collaboration	John Gray, ITI TranscenData

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