S.H. Yang, H. Zhang, M. Nosonovsky and K.-H. Chung, "Effects of contact geometry on pull-off force measurements with a colloidal probe", Langmuir, 24, No.3 (2008) 743-748.
S.H. Yang, H. Zhang, M. Nosonovsky and K.-H. Chung, "Nanoscale water capillary bridges under deeply negative pressure", Chemical Physics Letters, 451, Issue 1-3, (2008) 88-92.
S.H. Yang, Y. Kim, K.P. Purushothamb, J.-M. Yoo, Y. Choi and N. Dagalakis, “AFM characterization of nanopositioner in-plane stiffnesses”, Sensors and Actuators A, in press, 2010.
S.H. Yang, Y. Kim, J.-M. Yoo and N. Dagalakis, "microelectromechanical system based Steward platform with sub-nano resolution," Appl. Phys. Lett., vol 101 061909 (2012).
Dr. Seung Ho Yang was elected as a member of American Society of Mechanical Engineers (ASME) in the year 2008. He currently serves as reviewers of many journals; "Nanotechnology", "Journal of Micromechanics and Microengineering", "Measurement Science and Technology", "Journal of Physics D", "Philosophical Transactions of the Royal Society A" and "Sensors and Actuators A."
Intelligent Systems Division
Systems Integration Group
1991 – 1998 Research Scientist, Materials Research Group, SAMSUNG
1994 – 1996 Joint research projects between SAMSUNG and Russian Academy of Science.
1996 – 2002 Student Researcher, Korea Institute of Science and Technology (KIST).
2002 – 2003 Post Doctorial Research Fellow, KIST
2003 – 2007 Guest Researcher, Nanomechanical Properties Group, MSEL, National Institute of Standards and Technology (NIST)
2007 – present Research Associate, Intelligent Systems Div., National Institute of Standards and Technology (NIST)
Ph.D, Mechanical Engineering, Yonsei University (2002), South Korea
Master of Science, Mechanical Engineering, Yonsei University (1998), South Korea
Bachelor of Science, Metallurgical Engineering, Yonsei University (1988), South Korea