Topic Areas in EEEL

EEEL
EEEL Divisions and Groups
Forecasts and Strategic Plans
Research Opportunities
Vision, Mission, and Values
EEEL Organization
EEEL
Advanced Materials Programs/Projects in EEEL
Bioscience & Health Programs/Projects in EEEL
Characterization in EEEL
EEEL Programs/Projects
Electromagnetics Programs/Projects in EEEL
Energy Programs/Projects in EEEL
Magnetics Programs/Projects in EEEL
Microelectronics Programs/Projects in EEEL
Molecular Electronics in EEEL
Nanoelectronics Programs/Projects in EEEL
News in EEEL
Optical Properties of Materials Programs/Projects in EEEL
Optoelectronics Programs/Projects in EEEL
Quantum Electrical Measurements Programs/Projects in EEEL
Quantum Information and Measurements Programs/Projects in EEEL
Semiconductors Programs/Projects in EEEL
Sensors Information in EEEL
Superconductors Programs/Projects in EEEL
Wireless Programs/Projects in EEEL
Electromagnetics Division
Calibration Services
Related Software
Electromagnetics Division
NIST Discovers How Strain at Grain Boundaries Suppresses High-Temperature Superconductivity
Penetrating Insights: NIST Airframe Tests Help Ensure Better Shielding for Flight Instruments
Random Antenna Arrays Boost Emergency Communications
Magnetics Programs/Projects in Electromagnetics Division
Superconductors Programs/Projects in Electromagnetics Division
Antenna Metrology Project
Magnetics Group
Magnetics Publications
Magneto-Mechanical Measurements for High Current Applications 2005
Magneto-Mechanical Measurements for High Current Applications 2006
NRC Postdoctoral Research Associateships
Standard for Superconductor Characterization 2001
Standards for Superconductor and Magnetic Measurements 2005
Standards for Superconductor Characterization(2002)
Standards for Superconductor Characterization(2004)
Standards for Superconductors and Magnetic Measurements 2006
Superconductivity Publications
Superconductor Electromagnetic Measurements(2001)
Superconductor Electromagnetic Measurements(2002)
Superconductor Electromagnetic Measurements(2004)
Magnetics Group
Biomagnetics
Nanomagnetics
Superconductivity
Radio-Frequency Electronics Group
Advanced Materials Metrology Publications
Characterization of Planar Transmission Lines
Coupled Lines/Multiport Measurement/Orthogonal Calibration
Journal and Conference Publications for Dylan Williams
NIST/Industrial MMIC Consortium
On-Wafer Calibration, Measurement, and Measurement Verification
Publications by Dylan Williams (Topic Based)
Thermal Noise Metrology Project Publications
Thermal Noise Metrology Project Talks
Thin-Film/Low-K Dielectric Constant Measurement
Radio-Frequency Electronics Group
Advanced High Frequency Devices
Advanced Materials Metrology
Fundamental Guided Wave Metrology
High Speed Electronics
Thermal Noise Metrology
Dylan Williams
Radio-Frequency Fields Group
Publication List for Kate Remley
Radio-Frequency Fields Group
Antenna Metrology
Field Parameter Metrology
Wireless Systems Metrology
High Megawatt
2007 High-Megawatt Converter Workshop
2008 High-Megawatt Power Converter Technology R&D Roadmap Workshop
2009 Workshop on Future Large CO2 Compression Systems
NIST - DOC High-Megawatt Converter Workshop
Presentations from the 2007 High-Megawatt Converter Workshop
Presentations from the 2008 High-Megawatt Power Converter Technology R&D Roadmap Workshop
Presentations from the 2009 Workshop on Future Large CO2 Compression Systems
OLES
Office of Law Enforcement Standards (OLES)
First Labs Approved for Testing Communications Interoperability
Improved Measurements Could Mean Safer, More Reliable Electroshock Weapons
New Program Evaluates Labs for Emergency Communications Tests
NIST Helping Improve Speed Measurements for Cars, Bullets
Ballistics Programs/Projects in OLES
Biometrics Programs/Projects in OLES
Communications Programs/Projects in OLES
Forensics Information in EEEL
Weapons & Protective Systems Programs/Projects in OLES
Critical Incident Technologies
Detection, Inspection, and Enforcement Technologies
Forensic Sciences
Public Safety and Security Technologies
Public Safety Communication Systems
Weapons and Protective Systems Program
Microelectronics Programs
OMP Staff
Office of Microelectronics Programs
Is Your Microrobot Up for the (NIST) Challenge?
Nanosoccer Robots Ready to Compete in Upcoming RoboCup Games
Advanced Materials in Microelectronics Programs Division
Characterization in Microelectronics Programs Division
Microelectronics Programs/Projects in Microelectronics Programs Division
Molecular Electronics in Microelectronics Programs Division
Joaquin Martinez de Pinillos
Yaw Obeng
Optoelectronics Division
Igor Vayshenker Receives 2007 Allen V. Astin Award
Lehman, Cromer, and Li Receive 2008 FLC Technology Transfer Award
Paul Boynton Receives 2008 William P. Slichter Award
Sae Woo Nam Receives 2008 Arthur S. Flemming Award
NRC Postdoc Opportunities in Optoelectronics
Optoelectronics Employment Opportunities
Optoelectronics Staff Directory
Optoelectronics Division
Applying Neural Networks
High-Order Coherences of Chaotic and Coherent Light
New Nanotube Coating Enables Novel Laser Power Meter
New NIST Method Reveals All You Need to Know About ‘Waveforms’
NIST’s LIDAR May Offer Peerless Precision in Remote Measurements
Novel Laser Attenuator
Photoluminescence from GaN Nanowires
Uncertainty Analysis for Pulse Parameters
Vibrationally Robust Frequency Comb
Advanced Materials Programs/Projects in Optoelectronics
Awards in Optoelectronics
Display Metrology Programs/Projects in Optoelectronics Division
Nanoelectronics and Nanoscale Electronics Programs/Projects in Optoelectronics
News in Optoelectronics
Optical Properties of Materials Programs/Projects in Optoelectronics Division
Quantum Information and Measurements Programs/Projects in Optoelectronics
Semiconductors Programs/Projects in Optoelectronics
Sensors Programs/Projects in Optoelectronics
Optical Fiber and Components
Optical Fiber and Components Group
Fiber Sources and Applications
Optoelectronic Manufacturing Group
Optoelectronic Manufacturing Group
Nanostructure Fabrication and Metrology
Optical Materials Metrology
Quantum Information and Terahertz Technology
Semiconductor Growth and Devices
Sources, Detectors, and Displays
Sources, Detectors, and Displays Group
Display Metrology
Laser Radiometry
Quantum Electrical Metrology Division
About the QEMD
Jobs in the Quantum Electrical Metrology Division
Quantum Electrical Metrology Division Facilities
Surge Protection in Low-Voltage AC Power Circuits
Quantum Electrical Metrology Division
NIST Announces Three-Phase Plan for Smart Grid Standards
NIST Super-Sensors to Measure ‘Signature’ of Inflationary Universe
Standards Development Plan for ‘Smart Grid’ Announced
Webinars on Planning for Smart Grid Panel Announced
Electric Power Metrology Programs/Projects in Quantum Electrical Metrology Division
Electrical Quantities Programs/Projects in Quantum Electrical Metrology Division
Hall Effect Information
Quantum Information and Measurements Programs/Projects in Quantum Electrical Metrology Division
Sensors Programs/Projects in Quantum Electrical Metrology Division
Terahertz Technology Information
NIST ac-dc Difference Project
AC-DC Calibrations
AC-DC Contacts
AC-DC Introduction
AC-DC News
AC-DC Research
AC-DC Useful Links
ACDC Home Page
CTTS
International Activities
MJTC Research
Quantum AC Source
Range Extensions
Thermal Converter Calibrations
Thermal Converter Tutorial
Thermoelement Tutorial
Applied Electrical Metrology Group
Applied Electrical Metrology Group
Electric Power Metrology and the Smart Grid
Farad and Impedance Metrology
Quantum Devices Group
Quantum Devices Group
Quantum Information and Measurements
Quantum Magnetic Sensors and Materials
Quantum Sensors
Quantum Voltage System Development and Dissemination
Fundamental Electrical Measurements Group
Fundamental Electrical Metrology Group
AC-DC Difference
Electronic Kilogram
Metrology of the Ohm
Quantum Conductance Project/Graphene-Based Quantum Metrology
Semiconductor Electronics Division
A Framework for Bioelectronics: Discovery and Innovation
About the SED
Hall Effect Measurements
Mission, Vision, and Values
Semiconductor Electronics Division
Semiconductor Electronics Division Home
Hankering for Molecular Electronics? Grab the New NIST Sandwich
Memory with a Twist: NIST Develops a Flexible Memristor
NIST Calculations May Improve Temperature Measures for Microfluidics
NIST Engineers Discover Fundamental Flaw in Transistor Noise Theory
Novel Temperature Calibration Improves NIST Microhotplate Technology
Bioscience & Health Programs/Projects in Semiconductor Division
Characterization Programs/Projects in Semiconductor Division
Documentary Standards Programs/Projects in Semiconductor Division
Electric Power Metrology Programs/Projects in Semiconductor Division
Microelectromechanical Systems (MEMS) Programs/Projects in Semiconductor Division
Molecular Electronics Programs/Projects in Semiconductor Division
Nanoelectronics Programs/Projects in Semiconductor Division
David G. Seiler
Herbert S. Bennett
CMOS and Novel Devices
CMOS and Novel Devices Group
CMOS Device and Reliability
Macro Electronics
Nanoelectronic Device Metrology
Charles Cheung
Curt A. Richter
David Gundlach
John S. Suehle
Metrology Conference
2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, 2009 Presentations
Frontiers of Characterization and Metrology for Nanoelectronics, Archived Talks
Frontiers of Characterization and Metrology for Nanoelectronics, Past Conferences
Metrology Frontiers Conference
Electronic Information Group
Electronic Information Group
Infrastructure for Integrated Electronics Design and Manufacturing
Knowledge Facilitation
Kevin Brady
Enabling Devices
Enabling Devices Group
MicroNanoTechnology
Nanobiotechnology
Power Device and Thermal Metrology
Allen R. Hefner, Jr.
Janet Marshall
John Kasianowicz
Joseph J. Kopanski
Michael Cresswell
Michael Gaitan, Group Leader
Microrobotics
RoboCupSoccer - Nanogram Competition
Mobile Microrobotics Competition
Mobile Microelectronics Competition
Nanogram
RoboCupSoccer - Nanogram Competition
Summer Undergraduate Research Fellowship
2009 SURF Students
Amine Lambarqui
Andrew Dupree
Andrew Steinmann
Ben Keller
Brad Dinardo
David Jia
EEEL Summer Undergraduate Research Fellowship Program
Emmett Perl
John Garvey
Kathleen Schneibs
Laurie Stephey
Marian Ackun
Marjan Aslani
Matthew Walker
Michael Lorek
Nathan Shemonski
Wesley Chiu
William Ames
Contact

General Information:
301-975-2220 Telephone
301-975-4091 Facsimile

100 Bureau Drive, M/S 8100
Gaithersburg, MD 20899-8110