Semiconductor Electronics Division

Welcome

The Semiconductor Electronics Division (SED) provides leadership in developing the semiconductor measurement infrastructure essential to improving U.S. economic competitiveness. It provides necessary measurements, physical standards, and supporting data and technology; associated generic technology; and fundamental research results to industry, government, and academia. The primary mission of the Division is to provide technical leadership to industry, government, and academia in research and development of the semiconductor measurement and software infrastructure needs essential to the silicon microelectronics industry, advanced semiconductor materials technologies, and advanced electronic devices based upon molecular or quantum structures. The Division's programs also respond to industry measurement needs related to MicroElectroMechanical Systems (MEMS), power electronics, and various sub-areas of nanotechnology including nanoelectronics, nanocharacterization, nanobiotechnology, and plastic electronics.

The technical programs, their goals, technical strategies, activities, and accomplishments described here for each Division project clearly demonstrate the impact of the SED's leadership and effective service as it continues to respond to the needs of industry and to contribute to the scientific and engineering communities.

Thank you for your interest in our Division! I welcome your comments and suggestions.
 

David Seiler, Division Chief

News and Events
NIST Calculations May Improve Temperature Measures for Microfluidics

If you wanted to know if your child had a fever or be certain that the roast in the oven was thoroughly cooked, you would, of course, use a thermometer that you trusted to give accurate readings at …

Hankering for Molecular Electronics? Grab the New NIST Sandwich Hankering for Molecular Electronics? Grab the New NIST Sandwich

The flip-chip lamination method creates an ultra-smooth gold surface (left), which allows the organic molecules to form a thin yet even layer between the gold and silicon. Gold surfaces …

Novel Temperature Calibration Improves NIST Microhotplate Technology Novel Temperature Calibration Improves NIST Microhotplate Technology

Researchers at the National Institute of Standards and Technology (NIST) have developed a new calibration technique that will improve the reliability and stability of one of NIST's most …

Contact

General Information:
301-975-2054 Telephone
301-975-6021 Facsimile

100 Bureau Drive, M/S 8120
Gaithersburg, MD 20899-8120