The Radio-Frequency Electronics Group conducts theoretical and experimental research to develop basic metrology, special measurement techniques, and measurement standards necessary for advancing both conventional and microcircuit guided-wave technologies; for characterizing active and passive devices and networks; and for providing measurement services for scattering parameters, power, waveform, noise, material properties, and other basic quantities.
Advanced High Frequency Devices — The Advanced High Frequency Devices Program develops measurement methods to determine the characteristics of advanced electronics and devices at high frequencies. Relevant high-frequency devices …
Advanced Materials Metrology — Everywhere around us are materials that are composed of tiny molecules and atoms that are influenced by invisible electromagnetic rays that travel as radio waves, microwaves, and sunlight. Just how …
Fundamental Guided Wave Metrology — Radio-frequency (RF) waves and microwaves are involved with almost every facet of everyday life. Radio stations, television, wireless devices, satellite services, weather radar, and many more use …
High Speed Electronics — This project supports the microwave, telecommunications, computing, and emerging nanoelectronics industries through research and development of high-frequency microwave metrology …
Thermal Noise Metrology — This project develops methods for very accurate measurements of thermal noise and provides support for such measurements in the communications and electronics industries and in other government …