Advanced Materials Metrology

Everywhere around us are materials that are composed of tiny molecules and atoms that are influenced by invisible electromagnetic rays that travel as radio waves, microwaves, and sunlight. Just how these waves behave near and in materials has a strong influence on many areas of our life, from the TV we watch to devices in the doctor’s office. Understanding and harnessing the interaction of microwaves with materials and the electrical properties of materials is very important to the development of new medical technologies and new electronics. The primary objectives of the Advanced Materials Metrology Program are to develop, improve, and analyze measurements of the electromagnetic properties of materials from the large-scale down to the nanoscale. The emphasis for the program is on measurement methods for substrates, thin films, liquids, biological materials, and artificial materials. Our program will advance the state of the art by introducing advanced concepts based on the underlying physics that govern the nature and properties of the materials.

Over 100 years ago it dawned on scientists that a moving charge produced electromagnetic waves that traveled at the speed of light. Later it was found that these waves traveled as corpuscles called photons that interacted with materials. Electromagnetic devices cannot operate without the interaction of electromagnetic waves with materials, and the characterization of the interface between fields and materials will be a critical task for any device or metrology development from nanoscale to larger scales. EEEL areas of impact over the next 5 to 10 years will be developing measure ments at frequencies approaching 1 terahertz, defining theoretical concepts, and developing the optimum measurement tools to extend electromagnetic metrology and reference materials to the nanoscale. We will develop quantitative electromagnetic measurements of thin-film electronic materials, liquids, biomaterials, and other advanced materials over a wide range of experimental conditions including frequency, temperature, and magnetic fields. EEEL is performing state-of-the-art research that anticipates the measurement needs of industry years in advance in nondestructive substrate measurements, micro-fluidics, low- thin-film characterization, and near-field probing techniques. Industry, universities, other government laboratories, and standards committees have adopted many EEEL measurement methods. These include systems and test fixtures, best practices, and documentary standards. EEEL is expanding capabilities in advanced areas of near-field microwave microscopy, liquid characterization, and micro-fluidics. The benefits of this work are many. Quantifying the interaction of electromagnetic fields with matter is a fundamental measurement challenge. This work directly benefits and leads basic research and development in microelectronics, biotechnology, and nanotechnology and influences a wide range of commercial, military, and homeland security applications.

• Constructed and evaluated a liquid test fixture for the Transportation Security Administration (TSA).

• Completed a study of the interaction of radio-frequency to terahertz electromagnetic fields with material sizes from the macroscopic to nanoscale.

• Completed an electromagnetic analysis of near-field nanoscale probes.

• Completed an analysis of split-post and split-cylinder resonance techniques.

• Performed on-wafer metrology to study printed wiring board measurement problems.

Associated Publications/Reports:

• J. Baker-Jarvis, M. D. Janezic, J. H. Lehman, “Dielectric-Resonator Method for Measuring the Electrical Conductivity of Carbon Nanotubes from Microwave to Millimeter Frequencies,” Journal of Nanomaterials, vol. 2007, 12086, June 2007.
• J. Baker-Jarvis, M. D. Janezic, D. Love, T. M. Wallis, C. L. Holloway, P. Kabos, “Phase Velocity in Resonant Structures,” IEEE Transactions on Magnetics, vol. 42, pp. 3344-3346, October 2006.
• M. Janezic, J. Jargon, J. R. Baker-Jarvis, “Relative Permittivity Measurements Using the Higher-Order Resonant Mode of a Near-Field Microwave Probe,” International Union of Radio Science (URSI) (Chicago, IL), August 2008.