*

2012 NIST Portrait Gallery Honorees

William Boettinger, Material Measurement Laboratory, Years at NIST: 1972-2011
For scientific leadership in the application of rigorous principles of thermodynamics and kinetics to the design and control of critical industrial materials and processes.

Charles Glinka, NIST Center for Neutron Research, Years at NIST: 1975-2007
For developing and leading the best cold neutron nanoscale measurement capabilities in the United States , which are critical to the research needs of NIST and the Nation.

Brian Ronald Lawn, Material Measurement Laboratory, Years at NIST: 1982-2009
For seminal work and outstanding leadership in the development of indentation and fracture mechanics methods to measure the mechanical properties of materials resulting in profound advances in several scientific disciplines.

Richard Lindstrom, Material Measurement Laboratory, Years at NIST: 1972-2007
For exceptional and internationally recognized contributions to radioanalytical metrology, especially the development of instrumentation and procedures for prompt gamma-ray activation analysis and gamma-ray spectrometry, leading to unprecedented accuracy and precision in elemental analysis.

Paul Thomas Olsen, Physical Measurement Laboratory, Years at NIST: 1963-1994
For significantly advancing science and metrology through high accuracy determinations of fundamental constants, helping to establish the use of electrical constants as standards and their application in redefining the SI.

Stephen Michael Seltzer, Physical Measurement Laboratory, Years at NIST: 1962-2010
For an enduring foundation for safe and effective radiation dosimetry through his seminal contributions to radiation interactions and transport.

Terri Talbott, Innovation and Industry Services, Years at NIST: 1972-2011
For leadership in developing complex financial plans during long periods of fiscal uncertainty, critical for six directors to make the best strategic decisions for ATP and TIP.