Rachel Cannara

Rachel Cannara is a Project Leader in the Nanofabrication Research Group in the CNST. She received a B.S. in Physics with Highest Honors from the University of California, Santa Cruz, where her scholarship was recognized with numerous awards. She then received a Ph.D. in Physics from the University of Wisconsin-Madison, where she received the Hirschfelder Award for academic achievement and studied the tribological properties of single crystal diamond. Rachel joined the CNST staff in 2009 after two years as a Postdoctoral Fellow at the IBM Zurich Research Laboratory. Her current research focuses on the measurement and control of the mechanisms that govern nanoscale frictional energy dissipation, and the use of these discoveries to enable the design and operation of future nanomechanical and nanomanufacturing systems.

Selected Programs/Projects

• Nanotribology for Nanomanufacturing

Selected Publications

• R. W. Carpick and R. J. Cannara, "Atomic-level stick-slip," in Encyclopedia of Tribology, Q.J. Wang and Y.-W. Chung, Eds., New York: Springer, in press (2011).
• R.J. Cannara, "Nanoscale Friction: Measurement and Analysis," in Micro- and Nano Scale Phenomena in Tribology, Y.-W. Chung, Ed., New York: CRC Press, Taylor & Francis (2011). (October 18, 2011 publication date; http://www.crcpress.com/product/isbn/9781439839225)
  
• Scanning Thermal Microscopy for Fast Multiscale Imaging and Manipulation, R. J. Cannara, A. Sebastian, B. Gotsmann, and H. Rothuizen, IEEE Transactions on Nanotechnology 9, 745-753 (2010).
  Journal Web Site
  
• Thermo-mechanical Probe Storage at Mbps Single-probe Data Rates and Tbit in^-2 Densities, R.J. Cannara, B. Gotsmann, A. Knoll and U. Dürig, Nanotechnology 19, 395305 (2008).
• Nanoscale Friction Varied by Isotopic Shifting of Surface Vibrational Frequencies, R.J. Cannara, M.J. Brukman, K. Cimatu, A.V. Sumant, S. Baldelli and R.W. Carpick, Science 318, 780 (2007).
• Atomic-scale Friction on Diamond: A Comparison of Different Siding Directions on (001) and (111) Surfaces Using MD and AFM, G. Gao, R. J. Cannara, R.W. Carpick and J.A. Harrison, Langmuir 23, 5394 (2007).
• Lateral Force Calibration in Atomic Force Microscopy: A New Lateral Force Calibration Method and General Guidelines for Optimization, R.J. Cannara, M. Eglin and R.W. Carpick, Review of Scientific Instruments 77, 053701 (2006).
• Cantilever Tilt Compensation for Variable-load Atomic Force Microscopy, R.J. Cannara, M.J. Brukman and R.W. Carpick, Review of Scientific Instruments 76, 053706 (2005).