Hongwoo Baek

Hongwoo Baek is a CNST/SNU Postdoctoral Researcher in the Electron Physics Group.  She received a B.S. and a Ph.D. in Physics from Seoul National University, Korea.  Her doctoral research used scanning probe microscopy techniques to study monolayer and bilayer graphene on boron nitride substrates in order to characterize the effects of the graphene’s one-dimensional boundary on its electronic structure. Hongwoo is working with Joseph Stroscio as part of collaboration with Professor Young Kuk at Seoul National University using ultra-low temperature scanning tunneling microscopy to measure the electronic properties of layered materials, including graphene and topological insulators. 

Selected Publications

• Enhanced carrier transport along edges of graphene devices, J. Chae, S. Jung, S. Woo, H. Baek, J. Ha, Y. J. Song, Y.-W. Son, N. B. Zhitenev, J. A. Stroscio, and Y. Kuk, Nano Letters 12, 1839-1844 (2012).
  NIST Publication Database        Journal Web Site
• Graphene: Materials to devices (invited), J. Chae, J. Ha, H. Baek, Y. Kuk, S. Jung, Y. Song, N. Zhitenev, J. Stroscio, S. Woo, and Y. Son, Microelectronic Engineering 88, 1211-1213 (2011).
  NIST Publication Database        Journal Web Site
• Geometric and electronic structure of passive CuN monolayer on Cu(111) : A scanning tunneling microscopy and spectroscopy study, H. Baek, S. Jeon, J. Seo, and Y. Kuk, Journal of the Korean Physical Society 56, 620 (2010)