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Modeling and Simulation of Nanofabrication
Last Updated Date: 03/09/2012

Most manufacturing has historically been based on top-down fabrication and assembly.  With rapid advances in nanotechnology, there is increasing … more

Designing Advanced Scanning Probe Microscopy Instruments
Last Updated Date: 09/22/2011

A scanning probe microscope (SPM) in its simplest form uses a fine probe tip in proximity to a sample surface to measure a particular physical … more

Advanced Linear and Nonlinear Optical Metrology in support of next-generation Lithography
Last Updated Date: 11/09/2010

High precision linear and nonlinear optics of next-generation lithographic techniques is measured and characterized to enable these technologies. more

Fabrication and Metrology of Novel Magnetic Tunnel Junctions in the Ultra-thin Barrier Limit
Last Updated Date: 10/20/2010

Magnetic tunnel junctions, nanostructured by highly charged ions, are being probed and characterized to establish the foundation for novel … more

Computational Micromagnetics
Last Updated Date: 10/05/2010

NIST researchers develop simulation tools to support modeling, measurement and fundamental understanding of micromagnetic physics.

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