Infrared Imaging Beyond the Diffraction Limit
Last Updated Date: 07/09/2012
There are a variety of tools for characterizing nanoscale morphology and structure, such as scanning probe, scanning electron, and transmission … more
Designing Advanced Scanning Probe Microscopy Instruments
Last Updated Date: 09/22/2011
A scanning probe microscope (SPM) in its simplest form uses a fine probe tip in proximity to a sample surface to measure a particular physical … more
Last Updated Date: 10/05/2010
NIST researchers develop simulation tools to support modeling, measurement and fundamental understanding of micromagnetic physics.