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Characterization, Nanometrology, and Nanoscale Measurements Programs & Projects

(showing 46 - 60 of 66)
Superresolving Optical Microscopy
Last Updated Date: 10/02/2012

Light microscopy is a widely used analytical tool because it provides non-destructive, real-time, three-dimensional imaging with chemical and … more

Surface Potential Imaging of Solution Processable Acene-Based Thin Film Transistors
Last Updated Date: 10/02/2012

Scanning Kelvin probe microscopy (SKPM) of functioning solution processed thin film transistors is used to correlate film microstructure with … more

Trophic Transfer of Nanoparticles in a Simplified Invertebrate Food Web
Last Updated Date: 10/02/2012

We demonstrated that carboxylated and biotinylated quantum dots (QDs) can be transferred to higher trophic organisms (rotifers) through dietary … more

Mitigation of Systematic Errors in EFTEM Spectral Imaging via Median Filtering
Last Updated Date: 10/02/2012

A method has been developed for the removal from CCD images of point blemishes (PBs) ubiquitous in the acquisition of energy-filtered transmission … more

Evaluation of the Extent of Electron Scattering in a Low Vacuum Scanning Electron Microscope
Last Updated Date: 10/02/2012

Low vacuum scanning electron microscopes utilize gas molecules in the specimen chamber to neutralize the specimen charging from the impinging … more

DTSA-II Reinvention of a Classic
Last Updated Date: 10/02/2012

The original NBS/NIH DTSA (Desktop Spectrum Analyzer) software was widely used in the x-ray microanalysis research community. The combination of … more

Atomic Scale Imaging of Nanoscale Structures with Elemental Sensitivity in the NIST Titan 80-300
Last Updated Date: 10/02/2012

The characterization of CdSe/ZnS quantum dot structures has been carried out with compositionally sensitive imaging techniques utilizing the … more

Analysis of Copper Incorporation Into Zinc Oxide Nanowires
Last Updated Date: 10/02/2012

ZnO nanowires (NWs) are grown on bulk copper by chemical vapor deposition. Photoluminescence (PL) microscopy revealed band gap emission at 380 nm … more

Analysis of 3D Elemental Mapping Artifacts in Biological Specimens using Monte Carlo Simulation
Last Updated Date: 10/02/2012

We performed Monte Carlo simulation to demonstrate the feasibility of using the focused ion beam based X-ray microanalysis technique (FIB-EDS) for … more

3D Elemental Mapping of Cells using Electron and Ion Beams
Last Updated Date: 10/02/2012

Although it is the most commonly used technique for the chemical analysis of cells, mass spectrometry of cell lysate can only provide bulk … more

Novel Sources for Focused-ion Beams
Last Updated Date: 08/14/2012

Focused beams of ions have a wide range of uses, from nanoscale imaging to the fabrication of nanomaterials.  At the CNST, researchers are … more

Metrology of High Current Density Electron Field Emitters
Last Updated Date: 07/10/2012

Electron sources are ubiquitous in vacuum based electronics and are used for a variety of purposes.  These applications range from x-ray production … more

Infrared Imaging Beyond the Diffraction Limit
Last Updated Date: 07/09/2012

There are a variety of tools for characterizing nanoscale morphology and structure, such as scanning probe, scanning electron, and transmission … more

Measuring the Magneto-Electronic Properties of Graphene on the Nanometer Scale
Last Updated Date: 06/06/2012

The electrons in graphene are confined to the two-dimensional atomic layer of carbon atoms that make up the material .  Since graphene was first … more

Small Force Metrology
Last Updated Date: 05/30/2012

The Small Force Metrology project supports U.S. instrumentation vendors, academic researchers, government scientists, and a broad spectrum of … more

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