NIST logo
NIST Home > Characterization, Nanometrology, and Nanoscale Measurements Programs and Projects 
 

Characterization, Nanometrology, and Nanoscale Measurements Programs & Projects

(showing 46 - 60 of 64)
Fundamentals of Deformation
Last Updated Date: 04/16/2014

This project provides new measurement methods, property data and simulations for areas critical to US manufacturing, describing the mechanisms … more

Optoelectrical Characterization of Nanostructured Photovoltaic Materials and Devices
Last Updated Date: 03/24/2014

Photovoltaics technology is usually categorized into three generations: 1) devices based on polysilicon; 2) devices based on thin-film direct … more

Nanoscale Functional and Structural Characterization of Thin-Film Inorganic Solar Cells
Last Updated Date: 03/24/2014

Large-scale implementation of solar power generation requires photovoltaic (PV) devices with efficiency-to-cost ratios better than existing … more

Super-resolution Optical Microscopy
Last Updated Date: 03/24/2014

As the electronics and data storage industries build devices on ever decreasing scales, they need advanced imaging techniques that allow them to … more

Electronic Transport in Nanoscale Organic/Inorganic Devices
Last Updated Date: 09/23/2013

Organic materials (multi-carbon compounds) are amenable to almost Lego©-like tinkering with their structure and composition, and can exhibit a … more

Structure, Defects, and Scattering in Graphene
Last Updated Date: 04/10/2013

Since its discovery, graphene, a single atomic sheet of carbon atoms, has become a leading contender to be a key building-block material for … more

Theory of Transport in Graphene
Last Updated Date: 03/21/2013

Graphene, a single layer of carbon atoms, is one of the most likely materials to produce the next breakthrough in the electronics industry.  Ideal … more

Thin Film X-Ray Reflectometry
Last Updated Date: 10/09/2012

Our goal is to develop Standard Reference Materials (SRMs) and quantitative, reproducible X-ray reflectometry (XRR) data analysis methods to … more

Assessing the Internal Structure and Composition of Climatically-Relevant Atmospheric Particles
Last Updated Date: 10/02/2012

Atmospheric particles with long atmospheric lifetimes affect Earth's radiative balance. These particles typically consist of multiple chemical … more

Trophic Transfer of Nanoparticles in a Simplified Invertebrate Food Web
Last Updated Date: 10/02/2012

We demonstrated that carboxylated and biotinylated quantum dots (QDs) can be transferred to higher trophic organisms (rotifers) through dietary … more

Evaluation of the Extent of Electron Scattering in a Low Vacuum Scanning Electron Microscope
Last Updated Date: 10/02/2012

Low vacuum scanning electron microscopes utilize gas molecules in the specimen chamber to neutralize the specimen charging from the impinging … more

DTSA-II Reinvention of a Classic
Last Updated Date: 10/02/2012

The original NBS/NIH DTSA (Desktop Spectrum Analyzer) software was widely used in the x-ray microanalysis research community. The combination of … more

Atomic Scale Imaging of Nanoscale Structures with Elemental Sensitivity in the NIST Titan 80-300
Last Updated Date: 10/02/2012

The characterization of CdSe/ZnS quantum dot structures has been carried out with compositionally sensitive imaging techniques utilizing the … more

Analysis of Copper Incorporation Into Zinc Oxide Nanowires
Last Updated Date: 10/02/2012

ZnO nanowires (NWs) are grown on bulk copper by chemical vapor deposition. Photoluminescence (PL) microscopy revealed band gap emission at 380 nm … more

Analysis of 3D Elemental Mapping Artifacts in Biological Specimens using Monte Carlo Simulation
Last Updated Date: 10/02/2012

We performed Monte Carlo simulation to demonstrate the feasibility of using the focused ion beam based X-ray microanalysis technique (FIB-EDS) for … more

Contact
General Information:
301-975-NIST (6478)
inquiries@nist.gov

100 Bureau Drive, Stop 1070
Gaithersburg, MD 20899-1070