Characterization, Nanometrology, and Nanoscale Measurements Programs & Projects | |
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Analysis of 3D Elemental Mapping Artifacts in Biological Specimens using Monte Carlo Simulation
Last Updated Date: 10/02/2012 We performed Monte Carlo simulation to demonstrate the feasibility of using the focused ion beam based X-ray microanalysis technique (FIB-EDS) for … more
3D Elemental Mapping of Cells using Electron and Ion Beams
Last Updated Date: 10/02/2012 Although it is the most commonly used technique for the chemical analysis of cells, mass spectrometry of cell lysate can only provide bulk … more
Novel Sources for Focused-ion Beams
Last Updated Date: 08/14/2012 Focused beams of ions have a wide range of uses, from nanoscale imaging to the fabrication of nanomaterials. At the CNST, researchers … more
Optoelectrical Characterization of Nanostructured Photovoltaic Materials and Devices
Last Updated Date: 07/10/2012 Photovoltaics technology is usually categorized into three generations: 1) devices based on polysilicon; 2) devices based on thin-film direct … more
Nanoscale Functional and Structural Characterization of Thin-Film Inorganic Solar Cells
Last Updated Date: 07/10/2012 Large-scale implementation of solar power generation requires photovoltaic (PV) devices with efficiency-to-cost ratios better than existing … more
Metrology of High Current Density Electron Field Emitters
Last Updated Date: 07/10/2012 Electron sources are ubiquitous in vacuum based electronics and are used for a variety of purposes. These applications range from x-ray … more
Infrared Imaging Beyond the Diffraction Limit
Last Updated Date: 07/09/2012 There are a variety of tools for characterizing nanoscale morphology and structure, such as scanning probe, scanning electron, and transmission … more
Electron Transport in Graphene
Last Updated Date: 06/06/2012 Graphene, a one-atom thick sheet of carbon, shows great promise as a material for building nanometer-scale electronic devices that would help to … more
Measuring the Magneto-Electronic Properties of Graphene on the Nanometer Scale
Last Updated Date: 06/06/2012 The electrons in graphene are confined to the two-dimensional atomic layer of carbon atoms that make up the material . Since graphene … more
Probing Graphene Electronic Devices with Atomic Scale Measurements
Last Updated Date: 06/06/2012 The interest in using graphene as an electronic material arises in large part from the high speed with which electrons move through the material … more
Small Force Metrology
Last Updated Date: 05/30/2012 The Small Force Metrology project supports U.S. instrumentation vendors, academic researchers, government scientists, and a broad spectrum of … more
Mechanical Metrology Program
Last Updated Date: 05/30/2012 Providing critical measurements of mass, force, vibration, and acoustics for a broad range of industries and aspects of everyday life. Such … more
Fluctuations and Nanoscale Control
Last Updated Date: 03/29/2012 The behavior and properties of macroscale objects are stable and predictable because they are the result of the average behavior of very large … more
Modeling and Simulation of Nanofabrication
Last Updated Date: 03/09/2012 Most manufacturing has historically been based on top-down fabrication and assembly. With rapid advances in nanotechnology, there is … more
In Situ Characterization of Nanoscale Gas-Solid Interactions by TEM
Last Updated Date: 10/11/2011 Observing and measuring the dynamic changes that take place at the nanometer scale during the synthesis and use of carbon nanotubes (CNTs), … more |
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