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Characterization, Nanometrology, and Nanoscale Measurements Programs & Projects

(showing 1 - 15 of 67)
Traceable Scanning Probe Nano-Characterization
Last Updated Date: 09/23/2014

Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more

Nanoparticle Measurements and Standards for Biomedical Applications and Health
Last Updated Date: 09/22/2014

Our goal is to develop certified reference materials, standard test methods, measurements, and critical data for the physicochemical … more

Nanoelectronic Device Metrology
Last Updated Date: 09/15/2014

The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable emerging “Beyond-CMOS” … more

Optical Spectroscopy of Nanostructures
Last Updated Date: 09/15/2014

Understanding the underlying chemistry and physics of nanomaterials, including noble and transition metallic nanoparticles, carbon nanotubes, and … more

Three-Dimensional Nanometer Metrology
Last Updated Date: 09/15/2014

Three-dimensional measurements of nanometer-scale structures are of increasing importance for nanoscience and nanomanufacturing, including the … more

Analytical Transmission Scanning Electron Microscopy
Last Updated Date: 09/02/2014

This project develops low-energy transmission electron diffraction, imaging, and spectroscopy in the scanning electron microscope, to enable … more

Probing Graphene Electronic Devices with Atomic Scale Measurements
Last Updated Date: 06/17/2014

The interest in using graphene as an electronic material arises in large part from the high speed with which electrons move through the material — … more

Synchrotron X-ray Measurements
Last Updated Date: 05/21/2014

Our objective is to provide comprehensive descriptions of the structure of advanced materials and devices by performing synchrotron-based … more

Synchrotron X-ray Measurement Method Development
Last Updated Date: 05/21/2014

Our goal is to develop state of-the-art synchrotron X-ray measurement technology, including instrumentation, methods, and analytical tools, to … more

Synchrotron Beamline Operations
Last Updated Date: 05/21/2014

Our objective is to ensure that the NIST beamlines U7A, X23A2, and X24A, located at the National Synchrotron Light Source (NSLS) at Brookhaven … more

Magnetic Nanoparticle Metrology
Last Updated Date: 04/17/2014

We are developing best practice metrology for characterization of magnetic nanoparticle systems (e.g. blocking temperature, anisotropy, property … more

Microscopy Methods
Last Updated Date: 04/17/2014

This project is developing means of quantitatively measuring chemical distributions in three dimensions at the nanometer scale in materials with … more

Dimensional Metrology for Nanofabrication
Last Updated Date: 04/16/2014

Our goal is to develop measurements that quantify the shape, size, orientation, and fidelity of nanoscale patterns as a platform to quantitatively … more

Fundamentals of Deformation
Last Updated Date: 04/16/2014

This project provides new measurement methods, property data and simulations for areas critical to US manufacturing, describing the mechanisms … more

Optical Methods for 3-D Nanostructure Metrology
Last Updated Date: 04/03/2014

We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more

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