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Characterization, Nanometrology, and Nanoscale Measurements News

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CNST Releases the Winter 2012 Edition of The CNST News
Release Date: 02/08/2012

The NIST Center for Nanoscale Science and Technology (CNST) is pleased to announce the release of the winter 2012 edition of The CNST News. This … more

Hacking the SEM: Crystal Phase Detection for Nanoscale Samples
Release Date: 01/24/2012

Top: Transmission electron diffraction pattern from from a segment of an indium gallium nitride (InGaN) nanowire about 50 nanometers in diameter … more

NIST Releases First Certified Reference Material for Single-Wall Carbon Nanotubes
Release Date: 12/20/2011

The National Institute of Standards and Technology (NIST) has issued the world’s first reference material for single-wall carbon nanotube soot. … more

Branch Offices: New Family of Gold-Based Nanoparticles Could Serve as Biomedical 'Testbed'
Release Date: 06/21/2011

Gold nanoparticles are becoming the … well … gold standard for medical-use nanoparticles. A new paper* by researchers from the National Institute … more

NIST 'Catch and Release' Program Could Improve Nanoparticle Safety Assessment
Release Date: 06/07/2011

Depending on whom you ask, nanoparticles are, potentially, either one of the most promising or the most perilous creations of science. These tiny … more

Defect in Graphene May Present Bouquet of Possibilities
Release Date: 05/24/2011

Flower-like defects in graphene can occur during the fabrication process. The NIST team captured images of one of the defects (figures a and c) … more

Two Graphene Layers May Be Better Than One
Release Date: 04/26/2011

Researchers at the National Institute of Standards and Technology (NIST) have shown that the electronic properties of two layers of graphene vary … more

Getting the Point: Real-Time Monitoring of Atomic-Microscope Probes Adjusts for Wear
Release Date: 03/30/2011

Scientists at the National Institute of Standards and Technology (NIST) have developed a way to measure the wear and degradation of the … more

NIST to Cosponsor Conference in France on Nanoelectronics Metrology
Release Date: 03/15/2011

Registration is now open for the eighth international Frontiers of Characterization and Metrology for Nanoelectronics conference, cosponsored by … more

Real-World Graphene Devices May Have a Bumpy Ride
Release Date: 01/19/2011

Electronics researchers love graphene. A two-dimensional sheet of carbon one atom thick, graphene is like a superhighway for electrons, which … more

NIST Puts a New Twist on the Electron Beam
Release Date: 01/13/2011

'Electron Vortices' Have the Potential to Increase Conventional Microscopes' Capabilities Electron microscopes are among the most widely used … more

NIST’s New Scanning Probe Microscope is Supercool
Release Date: 12/08/2010

The discoveries of superconductivity, the quantum Hall effect and the fractional quantum Hall effect were all the result of measurements made at … more

The Perfect Nanocube: Precise Control of Size, Shape, and Composition
Release Date: 08/31/2010

With growing interest in using nanoparticles for everything from antibacterial socks to medical imaging to electronic devices, the need to … more

NIST Nanoscale Dimensioning Technique Wins R&D 100 Award
Release Date: 07/21/2010

A radical, new method developed at NIST that transforms the humble, ubiquitous and inexpensive optical microscope into a powerful … more

NIST Team Advances in Translating Language of Nanopores
Release Date: 06/23/2010

National Institute of Standards and Technology (NIST) scientists have moved a step closer to developing the means for a rapid diagnostic blood … more

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