NIST logo
NIST Home > Characterization, Nanometrology, and Nanoscale Measurements News 
 

Characterization, Nanometrology, and Nanoscale Measurements News

(showing 16 - 30 of 71)
New Quantum Dot Technique Combines Best of Optical and Electron Microscopy
Release Date: 06/12/2013

It's not reruns of "The Jetsons", but researchers working at the National Institute of Standards and Technology (NIST) have developed a new … more

CNST Hosts Workshop on In Situ Measurements using Transmission Electron Microscopy
Release Date: 06/06/2013

Three aspects of in situ transmission electron microscopy (TEM). On April 11 and 12, 2013, the NIST Center for Nanoscale Science and Technology … more

NIST Center for Nanoscale Science and Technology Featured on National Public Radio Affiliate WAMU
Release Date: 04/03/2013

The NIST Center for Nanoscale Science and Technology (CNST) was featured on the Friday, March 22 edition of Metro Connection , a weekly radio … more

Nanoscale Edge Variations Observed with Record-breaking Resolution in Magnetic Nanodevices
Release Date: 03/27/2013

Ferromagnetic resonance force microscopy image of the precession of an edge mode in a 500 nm diameter permalloy disk.  The disk appears as a blue … more

NIST Captures Chemical Composition with Nanoscale Resolution
Release Date: 02/12/2013

Researchers at the National Institute of Standards and Technology (NIST) and the University of Maryland have demonstrated that a new spectroscopy … more

New Platform Developed to Measure and Exploit Optomechanical Interactions
Release Date: 12/12/2012

A pair of nanobeams is held side-by-side and separated by a nanoscale gap, with one beam supporting a mechanical mode, and the other supporting a … more

Key Property of Graphene Sustained Over Wide Ranges of Density and Energy
Release Date: 11/14/2012

A collaboration led by researchers from the NIST Center for Nanoscale Science and Technology   has shown for the first time that charge carriers in … more

Researchers Observe, Control, and Optimize the Growth of Individual Carbon Nanotubes
Release Date: 10/31/2012

Bright field transmission electron micrograph showing carbon nanotubes grown from an array of equally-sized iron catalyst particles created by … more

Researchers Develop Versatile Optomechanical Sensors for Atomic Force Microscopy
Release Date: 10/24/2012

Top: Scanning electron micrograph of the chip-based optomechanical sensor. Bottom: Schematic of the disk-cantilever sensor geometry. Researchers … more

Slip Sliding Our Way: At the Nanoscale, Graphite Can Turn Friction Upside Down
Release Date: 10/16/2012

If you ease up on a pencil, does it slide more easily? Sure. But maybe not if the tip is sharpened down to nanoscale dimensions. A team of … more

Researchers Determine Critical Factors for Improving Performance of a Solar Fuel Catalyst
Release Date: 10/03/2012

False-color scanning electron micrographs of cross-sectioned hematite films grown by sputter deposition and then annealed at two different … more

A Fast and Sensitive Nanophotonic Motion Sensor Developed for Silicon Microdevices
Release Date: 09/19/2012

False-color scanning electron micrograph of a nanophotonic motion sensor. Vertical motion of the silicon nitride ring (pink) changes an evanescent … more

Researchers Introduce New Method for Imaging Defects in Magnetic Nanodevices
Release Date: 09/12/2012

Top: Scanning electron micrograph of an array of magnetic nanodisks with a oval-shaped “defect” structure at center.  Middle: Ferromagnetic … more

NIST ‘Hybrid Metrology’ Method Could Improve Computer Chips
Release Date: 09/05/2012

A refined method developed at the National Institute of Standards and Technology (NIST) for measuring nanometer-sized objects may help computer … more

Researchers Determine the Optimum Path for Tracking Fluorescent Nanoparticles Using a Laser
Release Date: 08/29/2012

NIST Center for Nanoscale Science and Technology   researchers Gregg Gallatin and Andrew Berglund (now at Quantifind in Palo Alto, CA) have … more

Contact
General Information:
301-975-NIST (6478)
inquiries@nist.gov

100 Bureau Drive, Stop 1070
Gaithersburg, MD 20899-1070