Characterization, Nanometrology, and Nanoscale Measurements News | |
|
New Quantum Dot Technique Combines Best of Optical and Electron Microscopy
Release Date: 06/12/2013 It's not reruns of "The Jetsons", but researchers working at the National Institute of Standards and Technology (NIST) have … more
CNST Hosts Workshop on In Situ Measurements using Transmission Electron Microscopy
Release Date: 06/06/2013 Three aspects of in situ transmission electron microscopy (TEM). On April 11 and 12, 2013, the more
NIST Center for Nanoscale Science and Technology Featured on National Public Radio Affiliate WAMU
Release Date: 04/03/2013 The NIST Center for Nanoscale Science and Technology (CNST) was featured on the Friday, March 22 edition of Metro Connection , a weekly radio … more
Nanoscale Edge Variations Observed with Record-breaking Resolution in Magnetic Nanodevices
Release Date: 03/27/2013 Ferromagnetic resonance force microscopy image of the precession of an edge mode in a 500 nm diameter permalloy disk. The disk appears … more
NIST Captures Chemical Composition with Nanoscale Resolution
Release Date: 02/12/2013 Researchers at the National Institute of Standards and Technology (NIST) and the University of Maryland have demonstrated that a new spectroscopy … more
New Platform Developed to Measure and Exploit Optomechanical Interactions
Release Date: 12/12/2012 A pair of nanobeams is held side-by-side and separated by a nanoscale gap, with more
Key Property of Graphene Sustained Over Wide Ranges of Density and Energy
Release Date: 11/14/2012 A collaboration led by researchers from the NIST Center for Nanoscale Science and Technology has shown for the first time that charge … more
Researchers Observe, Control, and Optimize the Growth of Individual Carbon Nanotubes
Release Date: 10/31/2012
Researchers Develop Versatile Optomechanical Sensors for Atomic Force Microscopy
Release Date: 10/24/2012 < more
Slip Sliding Our Way: At the Nanoscale, Graphite Can Turn Friction Upside Down
Release Date: 10/16/2012 If you ease up on a pencil, does it slide more easily? Sure. But maybe not if the tip is sharpened down to nanoscale dimensions. A team of … more
Researchers Determine Critical Factors for Improving Performance of a Solar Fuel Catalyst
Release Date: 10/03/2012 False-color scanning electron micrographs of cross-sectioned hematite films grown by sputter deposition and then annealed at two different … more
A Fast and Sensitive Nanophotonic Motion Sensor Developed for Silicon Microdevices
Release Date: 09/19/2012 False-color scanning electron micrograph of a nanophotonic motion sensor. Vertical motion of the silicon nitride ring (pink) changes an evanescent … more
Researchers Introduce New Method for Imaging Defects in Magnetic Nanodevices
Release Date: 09/12/2012 Top: Scanning electron micrograph of an array of magnetic nanodisks with a oval-shaped “defect” structure at center. … more
NIST ‘Hybrid Metrology’ Method Could Improve Computer Chips
Release Date: 09/05/2012 A refined method developed at the National Institute of Standards and Technology (NIST) for measuring nanometer-sized objects may help computer … more
Researchers Determine the Optimum Path for Tracking Fluorescent Nanoparticles Using a Laser
Release Date: 08/29/2012 NIST Center for Nanoscale Science and Technology researchers Gregg Gallatin and Andrew Berglund (now at Quantifind in Palo Alto, CA) … more |
Contact
General Information:301-975-NIST (6478) inquiries@nist.gov 100 Bureau Drive, Stop 1070 Gaithersburg, MD 20899-1070 |