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Characterization, Nanometrology, and Nanoscale Measurements News

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Research in Images: Cutaway View of Nanoparticles in a Neural Cell
Release Date: 11/26/2014

  NIST's Precision Imaging Facility (PIF) in Boulder, Colo., provides a variety of advanced tools for precisely measuring the structure and … more

NIST Offers Electronics Industry Two Ways to Snoop on Self-Organizing Molecules
Release Date: 10/22/2014

A few short years ago, the idea of a practical manufacturing process based on getting molecules to organize themselves in useful nanoscale shapes … more

Simultaneous Imaging of Ferromagnetic and Ferroelectric Domains
Release Date: 10/01/2014

SEMPA image of a 15 µm-diameter cobalt iron d more

NIST Shows Ultrasonically Propelled Nanorods Spin Dizzyingly Fast
Release Date: 07/21/2014

Vibrate a solution of rod-shaped metal nanoparticles in water with ultrasound and they'll spin around their long axes like tiny drill bits. Why? … more

CNST Releases the Winter/Spring 2014 Edition of The CNST News
Release Date: 05/28/2014

The NIST Center for Nanoscale Science and Technology (CNST) is pleased to announce the release of the Winter/Spring 2014 edition of The CNST News. … more

Don't Blink! NIST Studies Why Quantum Dots Suffer from 'Fluorescence Intermittency'
Release Date: 05/20/2014

Researchers at the National Institute of Standards and Technology (NIST), working in collaboration with the Naval Research Laboratory, have found … more

This FIB Doesn’t Lie: New NIST Microscope Sees What Others Can’t
Release Date: 05/06/2014

Microscopes don't exactly lie, but their limitations affect the truths they can tell. For example, when operated in their most typical high-energy … more

No Compromises: JILA's Short, Flexible, Reusable AFM Probe
Release Date: 04/08/2014

JILA researchers have engineered a short, flexible, reusable probe for the atomic force microscope (AFM) that enables state-of-the-art precision … more

Looking Inside: Assessing the Chemical Composition of a Metal-Organic Framework with Nanoscale Resolution
Release Date: 03/11/2014

Mixed-linker metal–organic frameworks were characterized using photothermal induced resonance (PTIR), a novel technique that combines the lateral … more

NIST Microanalysis Technique Makes the Most of Small Nanoparticle Samples
Release Date: 02/24/2014

Researchers from the National Institute of Standards and Technology (NIST) and the Food and Drug Administration (FDA) have demonstrated that they … more

Steve Blankenship Wins AVS George T. Hanyo Award for Outstanding Performance in Technical Support of Research
Release Date: 12/16/2013

Steve Blankenship holds the Hanyo award certificate at the 2013 AVS International Symposium and Exhibition. Left to right: John Russell, Jr. … more

Characterizing Solar Cells with Nanoscale Precision Using a Low-Energy Electron Beam
Release Date: 12/04/2013

Electron beam induced current (red) superimposed on a scanning electron micrograph (gray). Bright contrast in the vicinity of grain boundaries more

The NIST Center for Nanoscale Science and Technology Develops and Deploys New NanoFab Management Software
Release Date: 11/18/2013

NEMO's tool reservation calendar allows onsite NanoFab users to make and change reservations with a simple click-and-drag.     The Center for … more

CNST Releases the Fall 2013 Edition of The CNST News
Release Date: 11/14/2013

The NIST Center for Nanoscale Science and Technology (CNST) is pleased to announce the release of the Fall 2013 edition of The CNST News . This … more

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