National Institute of Standards and Technology
Publication Citation (NIST authors in bold)
Authors: Rippard, W. H., Pufall, M. R., Cecil, T. W., Silva, T. J., Russek, S. E., Schneider, M. L.
Title: Temperature dependence of spin-torque-driven self-oscillators
Published: October 15, 2009
Abstract: We have measured the temperature dependence of spin-torque-driven self-oscillations in point-contact nanooscillators for both in-plane and out-of-plane applied fields. We find that the linewidth for both field geometries is qualitatively similar. In the absence of observable low-frequency noise, at high temperatures the linewidth decreases roughly linearly as the temperature decreases. However, extrapolation of the quasilinear region to a zero-temperature linewidth intercept can yield either a positive or negative value. This variation in the zero-temperature linewidth intercept indicates that a range of mechanisms must be involved in setting the linewidth. When 1/ f noise is present in the device power spectrum, the linewidth varies quasiexponentially with temperature. While the linewidth versus temperature behavior is similar for both in-plane and out-of-plane applied fields, their output power versus current variation with temperature is qualitatively different.
Citation: Physical Review B
Volume: 80
Issue:
Pages: pp. 1-6
Keywords: spin electronics, magnetic dynamics, nanomagetism
Research Area: Nanoelectronics and Nanoscale Electronics;
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