Publication Citation (NIST authors in bold)
Authors:	Postek, M. T., Cavanagh, R. R., Allocca, C. M., Smith, D. T., Shull, .R.D. , Wollman, D. A., Seiler, D. G., Knight, S. , Diebold, A. , Silver, R. M., Clark, C. W., Lyons, K. W., Whetstone, J. R., Boisvert, R. F.
Title:	National Nanotechnology Initiative Interagency Workshop on Instrumentation and Metrology for Nanotechnology Grand Challenge Report
Published:	August 01, 2006
Abstract:
Conference:	National Nanotechnology Initiative Interagency Workshop on Instrumentation and Metrology for Nanotechnology
Location:	Gaithersburg, MD
Dates:	January 27-29, 2004
Keywords:	metrology, nanocharacterization, nanoelectronics, nanofabrication, nanomagnetic, nanomanufacturing, nanomechanics, nanotechnology, photonics
Research Area:	Manufacturing, Metrology;