Publication Citation (NIST authors in bold)
Authors:	Hale, P. D., Williams, D. F.
Title:	Calibrated Measurement of Optoelectronic Frequency Response
Published:	April 01, 2003
Abstract:	We describe a straightforward method for accurately measuring the frequency response of optoelectronic devices. The method uses a calibrated optical reference receiver, a modulated optical source, and a calibrated electrical vector network analyzer.
Citation:	IEEE Transactions on Microwave Theory and Techniques
Volume:	51
Issue:	4
Pages:	pp. 1422-1429
Keywords:	frequency response, measurement, optoelectronic devices, scattering matrices
Research Area:	;
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