## Time and Frequency Measurements## Characterization of Oscillators and Amplifiers
Stefania Romisch Trudi Peppler
Fees are subject to change without notice.back to top of page | back to index of time and frequency measurements ## Oscillator Frequency Calibration (77100C)NIST provides calibration services for oscillators with an output frequency of 1 Hz to 50 GHz. The relative standard uncertainty is nominally that of the NIST frequency standard, which is 5 x 10 back to top of page | back to index of time and frequency measurements ## Characterization of Atomic Frequency Standards (77110C)An atomic standard is characterized by comparing it against UTC (NIST). This characterization test determines the long-term performance of the standard in the time domain and requires 30 days of measurements. The 5-MHz output of the standard is sampled every 720 seconds and it is compared with the 5-MHz UTC (NIST) signal using the NIST time scale measurement system. The square root of the Allan deviation σ back to top of page | back to index of time and frequency measurements ## Characterization of Oscillators: Time Domain (77120C)NIST provides services to characterize the short-term performance, in the time domain, of frequency sources with a frequency of 5 MHz. The 5-MHz output of the source under test is sampled at 1s intervals and compared with the 5-MHz UTC (NIST) signal. The stability in terms of the square root of the Allan deviation σ back to top of page | back to index of time and frequency measurements ## Characterization of Oscillators and Amplifiers: Phase Noise in the Frequency Domain (77130C)NIST provides calibration services of the phase noise of single oscillators and amplifiers. For frequencies of 5 MHz to 26 GHz, phase modulation (PM) noise ^{2} /Hz. At a carrier frequency of 5 MHz, S can be measured to -145 dB for a frequency offset of 1 Hz and -190 dB for an offset of 10 kHz. At a carrier frequency of 100 MHz, _{φ}(ƒ)Scan be measured to -50 dB for a frequency offset of 1 Hz and -190 dB for an offset of 50 kHz. A typical value of standard uncertainty is 1 dB, but specific values depend on the carrier frequency and the offset frequency. Specific measurement requirements should be discussed prior to placing an order. PM noise for frequencies above this range (but less than 110 GHz) are covered under Service ID Number 77140S._{φ}(ƒ)back to top of page | back to index of time and frequency measurements ## Characterization of Oscillators and Amplifiers: Amplitude Noise in the Frequency Domain (77131C)NIST provides calibration services of amplitude noise of single oscillators and amplifiers. For frequencies from 1 MHz to 26 GHz, amplitude modulation (AM) noise S can be measured to -140 dB for a frequency offset of 1 Hz, and -180 dB for an offset of 10 kHz. At a carrier frequency of 100 MHz, _{α}(ƒ)S can be measured to -30 dB for a frequency offset of 1 Hz and -180 dB for an offset of 50 kHz. A typical value of standard uncertainty is 1 dB, but specific values depend on the carrier frequency and the offset frequency. Specific measurement requirements should be discussed prior to placing an order. AM noise for frequencies above this range (but less than 110 GHz) are covered under Service ID Number 77140S._{α}(ƒ)back to top of page | back to index of time and frequency measurements ## References—Calibration and Characterization of Oscillators and AmplifiersIntroduction to the Time Domain Characterization of Frequency Standards, J. Jesperson, Proc. 25th Annu. Precise Time and Time Interval (PTTI) Meeting, Pasadena, CA, 83-102 (Dec. 1991). An Introduction to Frequency Standards, L. Lewis, Proc. IEEE Properties of Signal Sources and Measurement Methods, D. A. Howe, D. W. Allan, and J. A. Barnes, in Characterization of Clocks and Oscillators, edited by D. B. Sullivan, D. W. Allan, D. A. Howe, and F. L. Walls, Natl. Inst. Stand. Technol. Tech. Note 1337, 14-16 (1990). Characterization of Clocks and Oscillators, D. B. Sullivan, D. W. Allan, D. A. Howe, and F. L. Walls, eds., NIST Tech. Note 1337 (Mar. 1990). Frequency and Time-Their Measurement and Characterization, S. R. Stein, Precision Frequency Control, Vol. 2, edited by E. A. Gerber and A. Ballato (Academic Press, NY), 191–232 (1985). back to top of page | back to index of time and frequency measurements |