TY  - CONF
AU  - Stenbakken, Gerard
C2  - Proc. IEEE Instrumentation and  Technology Conference (IMTC), Waltham, MA
DA  - 1995-04-01
LA  - en
PB  - Proc. IEEE Instrumentation and  Technology Conference (IMTC), Waltham, MA
PY  - 1995
TI  - Effects of Nonmodel Errors on Model-Based Testing
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=23215
ER  -