TY  - CONF
AU  - Randolph Elmquist
C2  - Proc. Metrologia 2000 Conference , Sao Paulo, BR
DA  - 2000-12-01
LA  - en
PB  - Proc. Metrologia 2000 Conference , Sao Paulo, BR
PY  - 2000
TI  - What Metrology Gains With Quantized Resistance Standards
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=29465
ER  -