TY  - GEN
AU  - Carlos R. Beauchamp
AU  - Johanna Camara
AU  - Jennifer Carney
AU  - Steven J. Choquette
AU  - Kenneth D. Cole
AU  - Paul C. DeRose
AU  - David L. Duewer
AU  - Michael Epstein
AU  - Margaret Kline
AU  - Katrice Lippa
AU  - Enrico Lucon
AU  - John L. Molloy
AU  - Michael Nelson
AU  - Karen W. Phinney
AU  - Maria Polakoski
AU  - Antonio Possolo
AU  - Lane C. Sander
AU  - John E. Schiel
AU  - Katherine E. Sharpless
AU  - Michael R. Winchester
AU  - Donald Windover
C2  - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2021-09-16 04:09:00
DO  - https://doi.org/10.6028/NIST.SP.260-136-2021
LA  - en
PB  - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2021
TI  - Metrological Tools for the Reference Materials and Reference Instruments of the NIST Material Measurement Laboratory
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=933027
ER  -