TY  - JOUR
AU  - Keller, Bob R.
AU  - Caplins, Benjamin
AU  - Holm, Jason
C2  - Microscopy and Analysis
DA  - 2022-06-01 04:06:00
LA  - en
M1  - 60
PB  - Microscopy and Analysis
PY  - 2022
TI  - STEM-in-SEM: A Re-Emerging Material Measurement Approach
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=934564
ER  -