TY  - JOUR
AU  - Jon Pratt
AU  - John Kramar
AU  - Gordon Shaw
AU  - Richard Gates
AU  - Paul Rice
AU  - John Moreland
C2  - IEEE Transactions on Nanotechnology
DA  - 2006-07-01 00:07:00
LA  - en
M1  - 1
PB  - IEEE Transactions on Nanotechnology
PY  - 2006
TI  - New reference standards and artifacts for nanoscale physical property characterization
ER  -