TY  - JOUR
AU  - McCrory, Duane
AU  - Anders, Mark
AU  - Ryan, Jason
AU  - Shrestha, Pragya
AU  - Cheung, Kin
AU  - Lenahan, Patrick
AU  - Campbell, Jason
C2  - IEEE Transactions on Device and Materials Reliability
DA  - 2018-03-20 00:03:00
LA  - en
M1  - 18
PB  - IEEE Transactions on Device and Materials Reliability
PY  - 2018
TI  - Wafer-Level Electrically Detected Magnetic Resonance:Magnetic Resonance in a Probing Station
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=925603
ER  -