TY  - JOUR
AU  - H Edwards
AU  - J Jorgensen
AU  - John Dagata
AU  - Y Strausser
AU  - J Schneir
C2  - Journal of Vacuum Science and Technology B
DA  - 1998-03-01 00:03:00
LA  - en
M1  - 16(2)
PB  - Journal of Vacuum Science and Technology B
PY  - 1998
TI  - Influence of Data Analysis and Other Factors on the Short-term Stability of Vertical Scanning-Probe Microscope Calibration Measurements
ER  -