TY  - CONF
AU  - Jerzy Krupka
AU  - Claude Weil
C2  - Proc., Intl. Microwave Conf. MIKON, Krakow, 1, PL
DA  - 1998-05-01 00:05:00
LA  - en
PB  - Proc., Intl. Microwave Conf. MIKON, Krakow, 1, PL
PY  - 1998
TI  - Recent Advances in Metrology for the Electromagnetic Characterization of Bulk Materials at Microwave Frequencies
ER  -