TY  - JOUR
AU  - Daniel van der Laan
AU  - John Ekin
AU  - Hans van Eck
AU  - M Dhalle
AU  - Bennie ten Haken
AU  - Michael Davidson
AU  - Justin Schwartz
C2  - Applied Physics Letters
DA  - 2006-01-17 00:01:00
LA  - en
M1  - 88
PB  - Applied Physics Letters
PY  - 2006
TI  - Effect of tensile strain on grain connectivity and flux pinning in Bi<sub>2</sub>Sr<sub>2</sub>Ca<sub>2</sub>Cu<sub>3</sub>O<sub>x</sub> tapes
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32118
ER  -