TY  - CONF
AU  - Randa, James
AU  - Sweeney, Susan
AU  - McKay, Tom
AU  - Walker, Dave
AU  - Greenberg, David
AU  - Tao, Jon
AU  - Mendez, Judah
AU  - Rezvani, G.
AU  - Pekarik, John
C2  - 66TH ARFTG MICROWAVE MEASUREMENTS CONFERENCE, Washington, DC, USA
DA  - 2005-12-01 00:12:00
LA  - en
PB  - 66TH ARFTG MICROWAVE MEASUREMENTS CONFERENCE, Washington, DC, USA
PY  - 2005
TI  - INTER-LABORATORY COMPARISON OF NOISE-PARAMETER MEASUREMENTS ON CMOS DEVICES WITH 0.12 um GATE LENGTH
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32120
ER  -