TY  - CONF
AU  - Mark VanLandingham
AU  - John Villarrubia
AU  - G Meyers
AU  - M Dineen
C2  - Proceedings of Microscopy and Microanalysis, Philadelphia, PA, USA
DA  - 2000-01-01 00:01:00
LA  - en
M1  - 6(2)
PB  - Proceedings of Microscopy and Microanalysis, Philadelphia, PA, USA
PY  - 2000
TI  - Advancing Nanoscale Indentation Measurements Toward Quantitative Characterization of Polymer Properties
ER  -