TY  - CONF
AU  - Han, X.
AU  - Stenbakken, Gerard
AU  - Zuben, F. Von
AU  - Engler, Hans
C2  - Proc. IEEE Instrumentation and  Technology Conference (IMTC), Baltimore, MD
DA  - 2000-05-01 00:05:00
LA  - en
M1  - 2
PB  - Proc. IEEE Instrumentation and  Technology Conference (IMTC), Baltimore, MD
PY  - 2000
TI  - Application of Neural Networks in the Development of Nonlinear Error Modeling and Test Point Prediction
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=7751
ER  -