TY  - CONF
AU  - Theodore Vorburger
AU  - Jun-Feng Song
AU  - Wei Chu
AU  - Thomas
AU  - Xiaoyu
AU  - James Yen
AU  - Robert Thompson
AU  - Richard
AU  - Benjamin Bachrach
AU  - Martin Ols
C2  - SPIE Scanning Microscopy, Monterey, CA
DA  - 2010-07-01 00:07:00
LA  - en
M1  - 7729
PB  - SPIE Scanning Microscopy, Monterey, CA
PY  - 2010
TI  - Topography measurements for correlations of standard cartridge cases
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905846
ER  -