TY  - GEN
AU  - Jolene Splett
AU  - Dominic Vecchia
AU  - Loren Goodrich
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2011-02-17
LA  - en
M1  - 116
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2011
TI  - A Comparison of Methods for Computing the Residual Resistivity Ratio of High-Purity Niobium
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=906197
ER  -