TY  - JOUR
AU  - Kristine Bertness
AU  - Kevin Cossel
AU  - F Adler
AU  - M Thorpe
AU  - Jun Ye
C2  - Applied Physics B-Photophysics and Laser Chemistry
DA  - 2010-07-20
LA  - en
M1  - 10
PB  - Applied Physics B-Photophysics and Laser Chemistry
PY  - 2010
TI  - Analysis of trace impurities in semiconductor gas via cavity-enhanced direct frequency comb spectroscopy
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=908253
ER  -